Assisitant Professor (Nano Center) Xiaobin Zhang (張 暁賓)
M1-65室, 0761-51-1500, email: zxiaobin , google scholar
Research Topics：Phase imaging of 2D materials by TIE method・Electrical conductance of graphene
Recent paper: Ultramicroscopy 158, 49-55 (2015).
D2 ISHIZUKA, Keisuke
"A study of nano-contact dynamic characteristics by TEM-AFM method"
Master thesis： A study of mechanical properties of gold nanocontact by in-situ TEM observation method using FM force sensor (JAIST)
presentation：日本物理学会、日本顕微鏡学会、応物学会、IVC20 etc.
D2 (Government-sponsored, MEXT) CHIEW, Yi Ling
"Operando TEM Observation of Atomic Switch Device"
D2 (Chinese Government-sponsored, CSC) LIU, Chunmeng
"A study of edge structure dependency of electrical conductance in suspended graphene nanoribbon"
D1 (Government-sponsored, MEXT) ZHANG, Jiaqi
"In situ TEM observation of mechanical properties of matllic atomic contacts"
D1 (Government-sponsored, MEXT) XIE, Lilin
「under consideration」
M2 OKUBO, Ryo
"Study on Edge Dependence of Electrical Conductive Properties of Graphene Nanoribbon"
M2 KURODA, Yuki
"A study of Electrical Conduction Characteristics of Semiconductor Nanowires by TEM-STM Method"
M2 KOBORI, Yuki
"crystal orientational dependence of Young's modulus of metal nano-contacts by TEM-AFM method"
M2 CHEN, Xin
"Operando TEM observation of metal corrosion process by developing Si chip for liquid cell"
M2 CHEN, Tongmin
「under consideration」
M1 TAIKI Siozawa
「under consideration」
M1 HIROMITSU Fujishima
「under consideration」
M1 TAKAMICHI Hosokawa
「under consideration」