原著論文, Original papers

  1. "Scanning moire fringe imaging for quantitative strain mapping in semiconductor devices",
    S. Kim, S. Lee, Y. Oshima, Y. Kondo, E. Okunishi, N. Endo, J. Jung, G. Byun, S. Lee and K. Lee,
    Applied Physics Letters 102 (2013) 161604 (4 pages).
  2. "Formation of Minibands on Superlattice Structure with Periodically Arranged δ-Doped Nitrogen into GaAs",
    K. Sumiya, M. Morifuji, Y. Oshima, F. Ishikawa
    Applied Physics Express 6, 041002 (2013).
  3. "In situ TEM observation of controlled gold contact failure under electric bias",
    Yoshifumi Oshima and Yoshihiko Kurui,
    Physical Review B 87(R), 081404 (5 pages) (2013).
  4. "Reversible Contrast in Focus Series of Annular Bright Field Images of a Crystalline LiMn2O4 Nanowire",
    Soyeon Lee, Yoshifumi Oshima, Eiji Hosono, Haoshen Zhou and Kunio Takayanagi,
    Ultramicroscopy 125, 43-48 (2013) .
  5. "Lorentzian-like image blur of gold nanoparticles on thick amorphous silicon films in ultra-high-voltage transmission electron microscopy",
    Y. Oshima, R. Nishi, K. Asayama, K. Arakawa, K. Yoshida, T. Sakata, E. Taguchi and H. Yasuda,
    Microscopy 62, 521-531 (2013)
  6. "In Situ TEM Observation of Local Phase Transformation in a Rechargeable LiMn2O4 Nanowire Battery",
    S. Lee, Y. Oshima, E. Hosono, H. Zhou, K. Kim, H. M. Chang, R. Kanno and K. Takayanagi,
    The Journal of Physical Chemistry C117, 24236-24241 (2013).
  7. "A-Type Antiferro-Orbital Ordering with I41/a Symmetry and Geometrical Frustration in the Spinel Vanadate MgV2O4",
    S. Niitaka, H. Ohsumi, K. Sugimoto, S. Lee, Y. Oshima, K. Kato, D. Hashizume, T. Arima, M. Takata and H. Takagi,
    Physical Review Letters 111 (26), 267201 (2013).

解説, Reviews

  1. 「収差補正電子顕微鏡と表面・界面科学」,
    高柳 邦夫, 大島 義文, 李 少淵, 田中 崇之, 谷城 康眞
    表面科学 34, 226-233 (2013).

招待講演, Invited talk

  1. 「電気化学反応セルの開発と電着反応その場観察」
    大島 義文
    その場観察研究部会第1回研究討論、2013年11月22日(山梨大学)
  2. "Electrical and mechanical properties of ballistic gold nanocontacts measured by in-situ TEM observation",
    Yoshifumi Oshima,
    Electron Microscopy and Multiscale Modeling (EMMM) 2013, Nov. 13th, p.66-67, Kyoto.
  3. 「収差補正ABF-STEM法によるLi原子の直接観察」
    大島 義文
    ナノテク産業化基盤技術の有効利用および 高度化と融合を目指した研究会2013
    2013年3月8日(九州大学)
  4. "Direct Observation of Electron or Mass Transport in Nano-Materials",
    Yoshifumi Oshima
    Japanese-German Workshop"Structure and Control of Interfaces", 9-11 January 2013, Berlin.

連絡先

北陸先端科学技術大学院大学 先端科学技術研究科 先端科学技術専攻 大島研究室

Japan Advanced Institute of Science and Technology, Oshima Labratory

〒923-1292 石川県能美市旭台1-1M1棟 61号室

Room 61, M1 building, 1-1 Asahidai, Nomi, Ishikawa 923-1292 Japan

Tel:(0761) 51 1500