October 28 (Mon)-30 (Wed), 2019
Tsukuba International Congress Center
"In-situ scanning electron microscopy observation of electrode–electrolyte interfaces in an electrochemical cell", HE, Gada (3Ca05)
"Mechanical properties of Pt atomic chain measured by TEM combined with a frequency-modulation force sensing system" ZHANG, Jiaqi (3Ea05S)
"Mechanical and structural evaluation of Au nanocontacts by simultaneous FM-AFM / TEM measurement"
ISHIZUKA, Keisuke (3Ea08S)
"Correlation between mechanical and electrical properties of gold nanocontacts in the atmosphere"
MITERA, Haruka (3Ea09)
"In-situ Electrical Conductance Measurement of Suspended Graphene Nanoribbon by Transmission Electron Microscopy" LIU, Chunmeng (3Bp03S)
"Fabrication of nanopores in graphene using electron beams" Zhang, Xiaobin (3Bp11Y)
2019 Annual Meeting of Electron Microscopy Society
October 15 (Tue)-18 (Fri), 2019
Hefei (China) International Hotel
"Mechanical properties of metal nano-contacts measured by TEM combined with frequency modulation force sensor" Yoshifumi Oshima (Oct. 17th, Room2, 16:20)
"Fabrication and electrical properties measurement of suspended graphene nanoribbon" Xiaobin Zhang (Oct. 18th, Room2, 8:45)
"Development of stretching TEM holder for 2D materals" Lilin Xie (Oct. 18th, Poster)
18th, September, 2019 ～21th, September
"In-situ Scanning Electron Microscopy Observation of Lead Dendrites" HE, Gada (18a-E318-6)
"In-situ Electrical Conductance Measurement of Suspended Graphene Nanoribbon by Transmission Electron Microscopy" LIU, Chunmeng (18p-E308-6)
「FM-AFM/TEM法による Auナノ接点の力学・構造同時計測」石塚 慧介 (19a-C310-3)
"Mechanical properties of Pt atomic chain measured by TEM combined with a frequency-modulation force sensing system" ZHANG, Jiaqi (19a-C310-4)
「STEMとDFT計算を用いた安四面銅鉱型Ag3P6Si3Sn2のフォノン物性解析」宮田 全展 (19p-E307-14)
「STEM Moire法によるInP/InGaAs/InP構造の歪みと組成分布の評価」陳 桐民 (20a-E318-3)
10th International Conference on Materials for Advanced Technologies (ICMAT)
23-28th, June in Singapore →Photo
"In-situ Measurement of Young's Modulus for Au Nanocontacts by Ultrahigh Vacuum TEM with Quartz Crystal Oscillator Sensor" Keisuke ISHIZUKA (oral No. 191550, 27th, June)
"Detection of Large Thermal Vibration for Cu Atoms in Tetrahedrite by High Angle Annular Dark Field Imaging",
T. MISHRA (No. 191584, 25th, June).
"Unravelling Planar Distribution of Intercalated Fe Atoms in TiS2 Layered Structure Using Transmission Electron Diffraction", Yi Ling CHIEW (No. 191189, 25th, June). Best Poster Award
"Measurement of InP / InGaAs Interfacial Strain Distribution by STEM Moiré Fringe Method",
Tongmin CHEN (No. 191163, 25th, June).
"Mechanical Properties of Pt Nano-contacts Measured by TEM Combined with a Frequency-Modulation Force Sensor", Jiaqi ZHANG (No. 191177, 25th, June).
"In-Situ Electrical Conductance Measurement of Suspended Graphene Nanoribbon by Transmission Electron Microscopy", Chunmeng LIU (No. 191540, 25th, June).
"Atomically Controlled Processing of Graphene by Electron Beam", Xiaobin ZHANG (oral No. 192393, 28th, June).
9th, March, 2019 ～12th, March
Tokyo Institute of Technology
“Electro-plating and stripping of lead dendrites observed by operando scanning electron microscopy with an electrochemical cell” HE, Gada (9a-S223-2)
「TEM-周波数変調法を用いたAuナノワイヤのヤング率方位依存性の測定」KOBORI, Yuki (9a-M112-7)
「サブ10nmスケールにおける金ナノ接点の定量的弾性評価」ISHIZUKA, Keisuke (9a-M112-8)
“Mechanical properties of Pt nano-contacts measured by TEM combined with a frequency-modulation force sensing system” ZHANG, Jiaqi (9p-PA5-3)
「グラフェンナノリボンよりカーボンアトミックチェンへの形成メカニズム」ZHANG, Xiaobin (9p-W521-16)
“Dislocation-Driven Growth of CuO Nanowires” XIE, Lilin (10p-PA4-5)
「STEMモアレフリンジ法によるInP/InGaAs界面歪み分布計測」CHEN, Tongmin (10p-S423-4)
“The Fabrication of Suspended Graphene Nanoribbon for In-situ Transmission Electron Microscopy Observation” LIU, Chunmeng (10p-PA8-38)
“Operando SEM observation of corrosion process of Al foil” CHEN, Xin (10p-PA5-11)
“Determination of intercalated Fe atomic arrangement in TiS2 layers using transmission electron diffraction” CHIEW, Yi Ling (11p-W521-18)
「TEM-STMホルダーを用いたシリコンナノワイヤの作製」KURODA, Yuki (12a-PB3-8)